EKK Technologies

EKK Technologies

Material analysis techniques

Example of thin-film analysis by XRD

The X-ray diffractometer (XRD) is used to distinguish between crystalline and amorphous substances according to the scattering intensity curves of X-rays dispersed by atoms and molecules that make up matter, and to identify, from diffraction patterns, what crystalline substances they comprise.

We use XRD to verify that different crystal structures occur depending on deposition rate. We also have XRD specifically designed for stress measurement, which is used to measure molded parts.

  • Example of thin-film analysis by XRD
  • Example of thin-film analysis by XRD

Other analyzers


The scanning electron microscope (SEM) is an instrument used to observe the form and composition in a minute area on the surface of a sample, while radiating and scanning an electron beam on the sample, detecting signals produced by the sample with various sensors, and displaying the signals as a secondary electron image.

It is possible to use SEM for observation within an accelerating voltage range of 0.5 to 30 kV, and a magnification range of x18 to x300,000.

SEM observation
  • SEM observation
  • Fatigue fracture surface
    Fatigue fracture surface

We have both EDS and WDS to analyze elements from 5B to 92U. EDS and WDS are used for quick analysis and detailed analysis of components, respectively.

Analysis by EDS
  • Cross section of the corrosion marks
    Cross section of the corrosion marks
    EDS mapping
    EDS mapping
  • EDS energy spectrum
    EDS energy spectrum
About Cookies
on this site :
This website uses cookies to improve your online experience. By continuing to use this website, we will assume that you are agreeing to our use of cookies. For more information about cookies, please visit our "Use of cookies" at Privacy Policy.