Material analysis techniques
Example of thin-film analysis by XRD
The X-ray diffractometer (XRD) is used to distinguish between crystalline and amorphous substances according to the scattering intensity curves of X-rays dispersed by atoms and molecules that make up matter, and to identify, from diffraction patterns, what crystalline substances they comprise.
We use XRD to verify that different crystal structures occur depending on deposition rate. We also have XRD specifically designed for stress measurement, which is used to measure molded parts.
The scanning electron microscope (SEM) is an instrument used to observe the form and composition in a minute area on the surface of a sample, while radiating and scanning an electron beam on the sample, detecting signals produced by the sample with various sensors, and displaying the signals as a secondary electron image.
It is possible to use SEM for observation within an accelerating voltage range of 0.5 to 30 kV, and a magnification range of x18 to x300,000.
We have both EDS and WDS to analyze elements from 5B to 92U. EDS and WDS are used for quick analysis and detailed analysis of components, respectively.